搜索包含 Scanning Electron Microscope Symposium (1974) 的图书 - 暨南大学图书馆

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	Gasdynamic and chemical lasers : proceedings of the international symposium, 11-15 October 1976, K̈Оln 0 索取号：TN248-53/E801/1976 作者：出版社：K̈Оln-Porz, Germany : DFVLR-Press, 1976,c[1977?]		Fundamental and applied laser physics : proceedings of the Esfahan Symposium, August 29 to September 5, 1971 0 索取号：TN24-53/E804 作者：出版社：New York, Wiley [1973]
	Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California 0 索取号：TN24-53/E904 作者：出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.		14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy 0 索取号：TP301-53/E991/14 作者：Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif : IEEE Computer Society Press, c1999.
	Electron energy loss spectroscopy and surface vibrations 0 索取号：TN01/E901 作者：Ibach、 H.、 1941-、Mills、 D. L.、出版社：New York : Academic Press, 1982.		ELF-VLF radio wave propagation : proceedings of the NATO Advanced Study Institute held at Sp̊Аtind, Norway, April 17-27, 1974 0 索取号：TN018-53/E801 作者：NATO Advanced Study Institute (1974 : Sp̊Аtind、 Norway)、Holtet、 J. A. (Jan A.)、 1939-、出版社：Dordrecht ; Boston : D. Reidel Pub. Co., 1974.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Advanced scanning electron microscopy and X-ray microanalysis 0 索取号：TN153/E901 作者：出版社：New York : Plenum Press, 1986.
	The chemical applications of transmission electron microscopy 0 索取号：TN153/E802 作者：Fryer、 J. R.、出版社：London ; New York : Academic Press, 1979.		Quantitative scanning electron microscopy 0 索取号：TN153/E801 作者：出版社：London ; New York : Academic Press, 1974.
	Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.		Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978 0 索取号：TN153-53/E801/10.3 作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.
	Semiconductor devices for power conditioning 0 索取号：TN303-53/E901/1981 作者：Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、出版社：New York : Plenum Press, 1982.		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.

	Gasdynamic and chemical lasers : proceedings of the international symposium, 11-15 October 1976, K̈Оln 0 索取号：TN248-53/E801/1976 作者：出版社：K̈Оln-Porz, Germany : DFVLR-Press, 1976,c[1977?]		Fundamental and applied laser physics : proceedings of the Esfahan Symposium, August 29 to September 5, 1971 0 索取号：TN24-53/E804 作者：出版社：New York, Wiley [1973]
	Optical thin films : [symposium] January 26-27, 1982, Los Angeles, California 0 索取号：TN24-53/E904 作者：出版社：Bellingham, Wash. : SPIE--the International Society for Optical Engineering, 1982.		14th Symposium on Logic in Computer Science : proceedings : July 2-5, 1999, Trento, Italy 0 索取号：TP301-53/E991/14 作者：Symposium on Logic in Computer Science (14th : 1999 : Trento、 Italy)、IEEE Computer Society. Technical Committee on Mathematical Foundations of Computing.、出版社：Los Alamitos, Calif : IEEE Computer Society Press, c1999.
	Electron energy loss spectroscopy and surface vibrations 0 索取号：TN01/E901 作者：Ibach、 H.、 1941-、Mills、 D. L.、出版社：New York : Academic Press, 1982.		ELF-VLF radio wave propagation : proceedings of the NATO Advanced Study Institute held at Sp̊Аtind, Norway, April 17-27, 1974 0 索取号：TN018-53/E801 作者：NATO Advanced Study Institute (1974 : Sp̊Аtind、 Norway)、Holtet、 J. A. (Jan A.)、 1939-、出版社：Dordrecht ; Boston : D. Reidel Pub. Co., 1974.
	Submillimeter wave : proceedings of the symposium 0 索取号：TN018-53/E802 作者：Symposium on Submillimeter Waves、 New York、 1970.、Fox、 Jerome、 ed.、Schlam、 Mark Howard、 ed.、Polytechnic Institute of Brooklyn. Microwave Research Institute.、出版社：Brooklyn, N.Y., Polytechnic Press; [distributors: Wiley Interscience, 1971		Digest : 1979 IEEE MTT-S International Microwave Symposium 0 索取号：TN019.2-7/E801/1979 作者：IEEE MTT-S International Microwave Symposium (1979 : Orlando、 Fla.)、Tracy、 John E、Institute of Electrical and Electronics Engineers、IEEE Microwave Theory and Techniques Society、出版社：New York : Institute of Electrical and Electronics Engineers, c1979
	Rational fault analysis 0 索取号：TN106/E802 作者：Symposium on Rational Fault Analysis、 Texas Tech University、 1974.、Saeks、 Richard、 1941-、Liberty、 Stanley R.、 1942-、United States. Office of Naval Research.、United States. Army Research Office.、出版社：New York : M. Dekker, 1977.		Advanced scanning electron microscopy and X-ray microanalysis 0 索取号：TN153/E901 作者：出版社：New York : Plenum Press, 1986.
	The chemical applications of transmission electron microscopy 0 索取号：TN153/E802 作者：Fryer、 J. R.、出版社：London ; New York : Academic Press, 1979.		Quantitative scanning electron microscopy 0 索取号：TN153/E801 作者：出版社：London ; New York : Academic Press, 1974.
	Scanning electron microscopy/1974 : proceedings of thept. 1: 7th annual scanning electron microscopy symposium ; pt. 2: Scanning electron microscopy and the plant sciences ; pt. 3: Advances in biomedical applications of the scanning electron microscope ; pt. 4: Failure analysis and the scanning electron microscope 0 索取号：TN153-53/E804/1974 作者：Scanning Electron Microscope Symposium (1974)、IIT Research Institute.、出版社：Chicago Ill. : IIT Research Institute, 1973.		Electron microscopy 1982 : [papers presented at the ninth International Congress on Electron Microscopy held in Toronto, Canada, August 1-9, 1978 0 索取号：TN153-53/E801/10.3 作者：International Congress on Electron Microscopy (10th : 19882 : West Germany、 Hamburg.)、Sturgess、 J. M.、Microscopical Society of Canada.、Electron Microscopy Society of America.、出版社：West German Toronto : Hamburg Microscopical Society of Canada, 1982,c1978.
	Semiconductor devices for power conditioning 0 索取号：TN303-53/E901/1981 作者：Brown Boveri Symposium on Semiconductor Devices for Power Conditioning (1981 : Brown Boveri Research Center)、Sittig、 Roland.、Roggwiller、 P.、出版社：New York : Plenum Press, 1982.		Defect recognition and image processing in III-V compounds : proceedings of the International Symposium on Defect Recogition and Image Processing in III-V Compounds (DRIP 1985), Montpellier, France, July 2-4, 1985 0 索取号：TN304-53/E901/1985 作者：International Symposium on Defect Recognition and Image Processing in III-V Compounds (1985 : Montpellier、 France)、Fillard、 J. P.、出版社：Amsterdam ; New York : Elsevier, 1985.